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UNI-T UTS3036B Spectrum Analyzer- 3.6Ghz

SKU: UTS306B
Rs. 245,000.00 MRP Rs. 285,000.00 Save Rs. 40,000.00 (15% off) Inclusive of GST-18%
In Stock (1 available) Delivery 2-6 days MOQ 1 piece Technical datasheet (PDF)
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The UTS3000B series spectrum analyser can measure frequencies up to 8.4GHz. It is a spectrum analyzer with wide frequency band coverage and superior performance. The series adopts mature all digital IF technology. It provides a variety of analysis functions, and up to 40001 scanning points, providing better help for your frequency domain analysis. This series of spectrum adopts a 10.1 inch large touch screen, which will bring you a better use experience. The UTS3000B series can be applied to functional/terminal/quality inspection tests in the electronics manufacturing industry, as well as wireless communication measurement, RF microwave courses, electromagnetic compatibility pre-scan, semiconductor measurement and many other application scenarios.

  • Frequency Range 9kHz–3.6GHz
  • Phase Noise -98 dBc/Hz @10kHz
  • Sweep Points 40,001
  • DANL -161dBm/Hz
  • RBW 1Hz-3MHz

ToolWorld is Authorized UNI-T Distributor

Includes calibration/conformity report

Product information

Everything you need to know

Technical Specifications

Model Number UTS3036B

Frequency Range           9kHz–3.6GHz

RBW      1Hz-3MHz

DANL    -161dBm/Hz

Traces  6

Scan Points       40,001

Tracking Generator       Optional

Display Size (in)               10.1in

Touchscreen     Yes

Product Dimensions (L x W x H)               15 in x 9 in x 5 in

Product Weight               10 lb

Certifications   CE/cETLus/UKCA

Documents       English download guide, multi-language safety manual, calibration report (COC)

Standard Accessories Power cord, USB2.0 printing cable

Warranty
3 Year

Recommended Uses

UTS3000B series can be applied to functional/terminal/quality inspection tests in the electronics manufacturing industry, as well as wireless communication measurement, RF microwave courses, electromagnetic compatibility pre-scan, semiconductor measurement and many other application scenarios.